共 15 条
[3]
INVESTIGATION OF EFFECTIVE-MEDIUM MODELS OF MICROSCOPIC SURFACE-ROUGHNESS BY SPECTROSCOPIC ELLIPSOMETRY
[J].
PHYSICAL REVIEW B,
1979, 20 (08)
:3292-3302
[5]
DIELECTRIC-PROPERTIES OF HEAVILY DOPED CRYSTALLINE AND AMORPHOUS-SILICON FROM 1.5 TO 6.0 EV
[J].
PHYSICAL REVIEW B,
1984, 29 (02)
:768-779
[7]
ELECTRICAL AND STRUCTURAL CHARACTERIZATION OF IMPLANTATION DOPED SILICON BY INFRARED REFLECTION
[J].
RADIATION EFFECTS AND DEFECTS IN SOLIDS,
1982, 60 (1-4)
:35-47
[10]
LAVINE JP, 1981, J APPL PHYS, V52, P6878