INTEGRATED-CIRCUIT YIELD STATISTICS

被引：216
作者：
STAPPER, CH [1 ]
ARMSTRONG, FM [1 ]
SAJI, K [1 ]
机构：
[1] IBM CORP, E FISHKILL FACIL, DIV GEN TECHNOL, HOPEWELL JUNCTION, NY 12533 USA
来源：
PROCEEDINGS OF THE IEEE | 1983年 / 71卷 / 04期
关键词：
D O I：
10.1109/PROC.1983.12619
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：453 / 470
页数：18
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