RELIABILITY OF MEDIUM-VOLTAGE VACUUM POWER CIRCUIT-BREAKERS

被引：3
作者：
HEISING, CR [1 ]
机构：
[1] GE,PHILADELPHIA,PA 19101
来源：
IEEE TRANSACTIONS ON RELIABILITY | 1983年 / 32卷 / 01期
关键词：
D O I：
10.1109/TR.1983.5221458
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：3 / 6
页数：4
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