USE OF THE DIRICHLET PROCESS FOR RELIABILITY-ANALYSIS

被引：0
|
作者：
CHIEN, WTK
KUO, W
机构：
来源：
COMPUTERS & INDUSTRIAL ENGINEERING | 1994年 / 27卷 / 1-4期
关键词：
DIRICHLET PROCESS; WEIBULL DISTRIBUTION; SIMULATION; VARIANCE REDUCTION; BURN-IN;
D O I：
暂无
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
Recently, many researchers apply the non-parametric Bayesian approach to predict the reliability of highly complex electronic systems. The Dirichlet process is the most common model for the non-parametric Bayesian analysis. The Kuo's simulation procedure [6] for Dirichlet process under a variance reduction techniques introduced in Chien and Kuo (1994) [2] is applied for a Weibull-distributed system. Optimal burn-in time is determined given the cost parameters. A model, the percentage of good items in a lot, is used to explain when the Dirichlet process is not a proper choice.
引用
收藏
页码：339 / 343
页数：5
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