ALGORITHMS FOR THE RAPID SIMULATION OF RUTHERFORD BACKSCATTERING SPECTRA

被引:2587
作者
DOOLITTLE, LR
机构
关键词
D O I
10.1016/0168-583X(85)90762-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:344 / 351
页数:8
相关论文
共 7 条
[1]   DEPTH PROFILING BY ION-BEAM SPECTROMETRY [J].
BORGESEN, P ;
BEHRISCH, R ;
SCHERZER, BMU .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1982, 27 (04) :183-195
[2]  
Chu WK., 1978, BACKSCATTERING SPECT
[3]  
Dongarra J. J., 1983, Computer Architecture News, V11, P22, DOI 10.1145/859551.859555
[4]   HOW ACCURATE ARE ABSOLUTE RUTHERFORD BACKSCATTERING YIELDS [J].
LECUYER, J ;
DAVIES, JA ;
MATSUNAMI, N .
NUCLEAR INSTRUMENTS & METHODS, 1979, 160 (02) :337-346
[5]  
RAUHALA E, 1983, HUP227 U HELS REP SE
[6]  
Ziegler J. F, 1977, HELIUM STOPPING POWE
[7]  
ZIEGLER JF, 1976, ION BEAM SURFACE LAY, P163