USE OF X-RAY PHOTOELECTRON AND AUGER-SPECTROSCOPY TO DETERMINE SURFACE COMPOSITION OF OXIDIZED VANADIUM

被引:15
作者
BRUNDLE, CR [1 ]
机构
[1] UNIV BRADFORD,SCH CHEM,BRADFORD,YORKSHIRE,ENGLAND
关键词
D O I
10.1016/0039-6028(75)90071-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:426 / 430
页数:5
相关论文
共 7 条
[1]   ULTRAHIGH-VACUUM ELECTRON SPECTROMETER FOR SURFACE STUDIES [J].
BRUNDLE, CR ;
ROBERTS, MW ;
LATHAM, D ;
YATES, K .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (04) :241-261
[2]   ELUCIDATION OF SURFACE-STRUCTURE AND BONDING BY PHOTOELECTRON-SPECTROSCOPY [J].
BRUNDLE, CR .
SURFACE SCIENCE, 1975, 48 (01) :99-136
[3]   APPLICATION OF ELECTRON-SPECTROSCOPY TO SURFACE STUDIES [J].
BRUNDLE, CR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :212-224
[4]  
BRUNDLE CR, TO BE PUBLISHED
[5]   INELASTIC EFFECTS AND STRUCTURE IN AUGER-ELECTRON EMISSION-SPECTRA OF V2O5(010) AND V(100) SURFACES - STUDY OF CHEMICAL-SHIFTS [J].
FIERMANS, L ;
VENNIK, J .
SURFACE SCIENCE, 1973, 35 (01) :42-62
[6]  
LARSSON R, 1973, CHEM SCRIPTA, V3, P88
[7]   AUGER-ELECTRON SPECTROSCOPY INVESTIGATIONS OF SURFACE CHEMICAL COMPOSITION OF VANADIUM, VANADIUM OXIDES, AND OXIDIZED VANADIUM CHEMICAL L SHIFT AND PEAK INTENSITY ANALYSIS [J].
SZALKOWS.FJ ;
SOMORJAI, GA .
JOURNAL OF CHEMICAL PHYSICS, 1972, 56 (12) :6097-+