DETERMINATION OF ISOTHERMAL SECTIONS OF NICKEL RICH PORTION OF NI-CR-MO SYSTEM BY ANALYTICAL ELECTRON-MICROSCOPY

被引:75
作者
RAGHAVAN, M
MUELLER, RR
VAUGHN, GA
FLOREEN, S
机构
[1] EXXON PROD RES CO,HOUSTON,TX 77001
[2] INT NICKEL CO INC,SUFFERN,NY 10901
来源
METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE | 1984年 / 15卷 / 05期
关键词
D O I
10.1007/BF02644553
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
27
引用
收藏
页码:783 / 792
页数:10
相关论文
共 27 条
[1]  
Barrows R. G., 1972, Metallography, V5, P515, DOI 10.1016/0026-0800(72)90041-9
[2]   MODIFIED SYSTEM FOR PREDICTING SIGMA FORMATION [J].
BARROWS, RG ;
NEWKIRK, JB .
METALLURGICAL TRANSACTIONS, 1972, 3 (11) :2889-&
[3]  
BLOOM DS, 1954, T AM I MIN MET ENG, V200, P261
[4]  
Butchers E, 1943, J I MET, V69, P209
[5]   THERMODYNAMICS AND PHASE-DIAGRAM OF FE-C SYSTEM [J].
CHIPMAN, J .
METALLURGICAL TRANSACTIONS, 1972, 3 (01) :55-&
[6]   QUANTITATIVE-ANALYSIS OF THIN SPECIMENS [J].
CLIFF, G ;
LORIMER, GW .
JOURNAL OF MICROSCOPY-OXFORD, 1975, 103 (MAR) :203-207
[7]  
Goldstein JI, 1977, SCANNING ELECTRON MI, V1, P315
[8]  
GOLDSTEIN JI, 1977, SCANNING ELECTRON MI, V1, P651
[9]  
Hall EO., 1966, METALL REV, V11, P61, DOI [10.1179/imr.1966.11.1.61, DOI 10.1179/IMR.1966.11.1.61]
[10]   Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns [J].
Hanawalt, JD ;
Rinn, HW ;
Frevel, LK .
INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION, 1938, 10 :0457-0512