ANGLE-RESOLVED PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SI(111) SQUARE-ROOT-3X-SQUARE-ROOT-3-SN SURFACE - COMPARISON WITH SI(111) SQUARE-ROOT-3X-SQUARE-ROOT-3-AL, SQUARE-ROOT-3X-SQUARE-ROOT-3-GA, AND SQUARE-ROOT-3XSQUARE-ROOT-3-IN SURFACES

被引：78
作者：
KINOSHITA, T
KONO, S
SAGAWA, T
机构：
来源：
PHYSICAL REVIEW B | 1986年 / 34卷 / 04期
关键词：
D O I：
10.1103/PhysRevB.34.3011
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：3011 / 3014
页数：4
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