SURFACE COMPOSITION AND CHEMISTRY OF EVAPORATED PERMALLOY-FILMS OBSERVED BY X-RAY PHOTOEMISSION SPECTROSCOPY AND BY AUGER-ELECTRON SPECTROSCOPY

被引：35

作者：

POLLAK, RA ^{[1
]}

BAJOREK, CH ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

关键词：

D O I：

10.1063/1.321736

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1382 / 1388

页数：7

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