CAVITY PHASE-SHIFT METHOD FOR HIGH REFLECTANCE MEASUREMENTS AT MID-INFRARED WAVELENGTHS

被引：11
|
作者：
KWOK, MA
HERBELIN, JM
UEUNTEN, RH
机构：
来源：
OPTICAL ENGINEERING | 1982年 / 21卷 / 06期
关键词：
D O I：
10.1117/12.7973018
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The cavity phase shift method can measure high reflectances on spherical surfaces with good spatial resolution. Successful demonstration at 2. 9 micrometers wavelength is described. A reflectance of 0. 9920 plus or minus 0. 0050 has been measured. 7 refs.
引用
收藏
页码：979 / 982
页数：4
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