A SCANNING FIELD-EMISSION MICROSCOPE

被引：6

作者：

SENDECKI, S

BARWINSKI, B

机构：

[1] Lnstitute of Experimental Physics, University of Wrochw, 50 204 Wroctaw

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1995年 / 6卷 / 03期

关键词：

D O I：

10.1088/0957-0233/6/3/008

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A novel instrument for imaging a field emission tip has been demonstrated. The principle of operation is the following. A scanning magnetic field guides a selected part of the emission current to a fixed electron collector through a hole in anode. The value of the measured current is simultaneously registered by a microcomputer. The X-Y magnetic scanning is also controlled by means of the microcomputer. The instrument allows us to make direct observations of the tip without any fluorescent screen, which improves the quality of the images and extends the possibilities of the field emission microscopy method.

引用

页码：306 / 309

页数：4

共 5 条

[1]

ELINSON MJ, 1958, AVTOELEKTRONNAJA EMI

[2] MOBILITY AND ADSORPTION OF HYDROGEN ON TUNGSTEN [J].