STRUCTURAL AND MAGNETOTRANSPORT PROPERTIES OF INGAAS/INALAS HETEROSTRUCTURES GROWN ON LINEARLY-GRADED AL(INGA)AS BUFFERS ON GAAS

被引:0
作者
GOLDMAN, RS [1 ]
CHEN, JH [1 ]
KAVANAGH, KL [1 ]
WIEDER, HH [1 ]
ROBBINS, VM [1 ]
MILLER, JN [1 ]
机构
[1] HEWLETT PACKARD LABS,PALO ALTO,CA 94304
来源
COMPOUND SEMICONDUCTORS 1994 | 1995年 / 141期
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中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We have investigated the structural and magnetotransport properties of modulation-doped In0.52Al0.48As/In0.53Ga0.47As/In0.52Al0.48As heterostructures grown by molecular beam epitaxy on GaAs (001) by means of linearly-graded Al-0.48(InzGa1-z)(0.52)As buffer layers. Studies by double-crystal x-ray diffraction and transmission electron microscopy indicate that the linearly-graded buffer is similar to 90% strain-relaxed in both [110] inplane directions with an epilayer tilt of 0.5 degrees about the [($) over bar 110] axis, and threading dislocation or stacking fault defect density approximately 10(7)/cm(2). The peak 1.6K apparent electron mobility, determined from Hall measurements in the [($) over bar 110] direction, 1.1 x 10(5)cm(2)/V-s, is comparable to the highest low-temperature mobility reported for a similar heterojunction grown on InP [7], and is consistent with the theoretical alloy-scattering limited mobility for such heterojunctions [8],[9]. Analysis of 1.6K Shubnikov de Haas oscillatory magnetoresistance measurements indicates two-subband occupation of the two-dimensional electron gas.
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页码:313 / 318
页数:6
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