IMPROVED FEEDBACK CHARGE METHOD FOR QUASI-STATIC CV MEASUREMENTS IN SEMICONDUCTORS

被引：77
作者：
MEGO, TJ
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1986年 / 57卷 / 11期
关键词：
D O I：
10.1063/1.1139046
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
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页码：2798 / 2805
页数：8
相关论文
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