SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY COMBINED

被引：28

作者：

BRYANT, PJ

MILLER, RG

YANG, R

机构：

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 26期

关键词：

D O I：

10.1063/1.99541

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2233 / 2235

页数：3

共 16 条

[1] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J].

ALBRECHT, TR ;

QUATE, CF .

JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :2599-2602

[2] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[3] ENERGY-DEPENDENT STATE-DENSITY CORRUGATION OF A GRAPHITE SURFACE AS SEEN BY SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

FUCHS, H ;

GERBER, C ;

ROHRER, H ;

STOLL, E ;

TOSATTI, E .

EUROPHYSICS LETTERS, 1986, 1 (01) :31-36

[4] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

GERBER, C ;

STOLL, E ;

ALBRECHT, TR ;

QUATE, CF .

EUROPHYSICS LETTERS, 1987, 3 (12) :1281-1286

[5]

DEMUTH JE, 1987, AIP C P, V160, P496

[6] TUNNELING AND SCANNING TUNNEL MICROSCOPY - A CRITICAL-REVIEW [J].

FEUCHTWANG, TE ;

CUTLER, PH .

PHYSICA SCRIPTA, 1987, 35 (02) :132-140

[7] ROLE OF TIP STRUCTURE IN SCANNING TUNNELING MICROSCOPY [J].

KUK, Y ;

SILVERMAN, PJ .

APPLIED PHYSICS LETTERS, 1986, 48 (23) :1597-1599

[8]

LELLONI A, 1985, PHYS REV B, V31, P2602

[9] ATOMIC FORCE MICROSCOPY OF LIQUID-COVERED SURFACES - ATOMIC RESOLUTION IMAGES [J].

MARTI, O ;

DRAKE, B ;

HANSMA, PK .

APPLIED PHYSICS LETTERS, 1987, 51 (07) :484-486

[10] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE [J].

MARTIN, Y ;

WILLIAMS, CC ;

WICKRAMASINGHE, HK .

JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) :4723-4729

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