VERY SMALL MOSFETS FOR LOW-TEMPERATURE OPERATION

被引:222
作者
GAENSSLEN, FH [1 ]
RIDEOUT, VL [1 ]
WALKER, EJ [1 ]
WALKER, JJ [1 ]
机构
[1] IBM CORP,THOMAS J WATSON RES CTR,SEMICONDUCTOR DEVICE & PROC DESIGN GRP,YORKTOWN HTS,NY 10598
关键词
D O I
10.1109/T-ED.1977.18712
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:218 / 229
页数:12
相关论文
共 40 条
[1]   LIQUID IMMERSION COOLING OF SMALL ELECTRONIC DEVICES [J].
BAKER, E .
MICROELECTRONICS AND RELIABILITY, 1973, 12 (02) :163-173
[2]  
COBBOLD RSC, 1966, ELECTRON LETT, V2, P190
[3]   TEMPERATURE DEPENDENCE OF AVALANCHE MULTIPLICATION IN SEMICONDUCTORS [J].
CROWELL, CR ;
SZE, SM .
APPLIED PHYSICS LETTERS, 1966, 9 (06) :242-&
[4]   DESIGN OF ION-IMPLANTED MOSFETS WITH VERY SMALL PHYSICAL DIMENSIONS [J].
DENNARD, RH ;
GAENSSLEN, FH ;
YU, HN ;
RIDEOUT, VL ;
BASSOUS, E ;
LEBLANC, AR .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (05) :256-268
[5]  
DENNARD RH, 1972, DEC IEEE INT EL DEV
[6]   ELECTROMIGRATION AND FAILURE IN ELECTRONICS - INTRODUCTION [J].
DHEURLE, FM .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1971, 59 (10) :1409-&
[8]   TRANSPORT PROPERTIES OF ELECTRONS IN INVERTED SILICON SURFACES [J].
FANG, FF ;
FOWLER, AB .
PHYSICAL REVIEW, 1968, 169 (03) :619-+
[9]  
GAENSSLEN FH, 1973, SEP EUR SOL STAT DEV
[10]  
GREEN RR, 1968, REV SCI INSTRUM, V30, P1495