A METHOD FOR MEASUREMENT OF LOSSES IN THE NOISE-MATCHING MICROWAVE NETWORK WHILE MEASURING TRANSISTOR NOISE PARAMETERS - REPLY

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MARTINES, G

SANNINO, M

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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1988年 / 36卷 / 01期

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TM [电工技术]; TN [电子技术、通信技术];

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0808 ; 0809 ;

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页码：170 / 172

页数：3

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