Modifications induced by swift heavy ions

被引：0
作者：
C Trautmann
机构：
[1] Gesellschaft für Schwerionenforschung,
来源：
Bulletin of Materials Science | 1999年 / 22卷
关键词：
Ion tracks; transmission electron microscopy; scanning force microscopy; small-angle X-ray scattering; track etching;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
On their way through matter, energetic heavy ions induce a continuous trail of ionization and excitation. A narrow path of irreversible physical, chemical and structural changes, the latent track, is formed. In this report, some of the most important techniques (transmission electron and atomic force microscopy, small-angle X-ray scattering, chemical etching) to study and to characterize ion induced modifications will be presented. Furthermore, selected examples for application oriented projects will be given.
引用
收藏
页码：679 / 686
页数：7
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