Characterization of Fe/Cr multilayers by analytical transmission electron microscopy

被引：0

作者：

R. Rennekamp

Jürgen Thomas

Birgit Arnold

Kazutomo Suenaga

机构：

[1] Institut für Festkörper- und Werkstofforschung Dresden,

[2] Postfach 270016,undefined

[3] D-01171 Dresden,undefined

[4] Germany,undefined

[5] Laboratoire de Physique des Solides associé au CNRS,undefined

[6] Bâtiment 510,undefined

[7] Université Paris-Sud,undefined

[8] F-91405 Orsay,undefined

[9] France,undefined

来源：

Fresenius' Journal of Analytical Chemistry | 1998年 / 361卷

关键词：

Transmission Electron Microscopy; Layer Thickness; Single Layer; Analytical Transmission Electron Microscopy; Typical Dimension;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Different techniques of analytical TEM were used to investigate Fe/Cr multilayers. These multilayers show a dependence of their electrical resistance as a function of the magnetic field. This effect called giant magnetoresistance can be utilized for example in magnetic recording heads. Typical dimensions of the single layer thickness are in the nanometer region. Therefore the microstructure of this material has been investigated by transmission electron microscopy (TEM). To get additional analytical information energy dispersive X-ray spectroscopy (EDXS) and electron energy loss spectroscopy (EELS) can be used.

引用

页码：621 / 625

页数：4