Structural and optical properties of CuIn0.35Al0.65Se2 thin films

被引：0
作者：
K. Srinivas
J. N. Kumar
G. H. Chandra
S. Uthanna
机构：
[1] Vellore Institute of Technology,Thin Film Laboratory, Department of Physics
[2] Sri Venkateswara University,Thin Film Laboratory, Department of Physics
来源：
Journal of Materials Science: Materials in Electronics | 2006年 / 17卷
关键词：
Selenium; Optical Absorption Coefficient; Conduction Band Minimum; Orbit Splitting; Perpendicular Polarization;
D O I：
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中图分类号：
学科分类号：
摘要：
CuIn0.35Al0.65Se2 thin films were deposited onto glass substrates by flash evaporation method. The films deposited at substrate temperatures 613–633 K were nearly stoichiometric, polycrystalline and single phase showing chalcopyrite structure with lattice parameters a = 0.569 nm and c = 1.124 nm. The optical absorption studies revealed a threefold optical structure near the fundamental edge with Eg1 = 1.75 eV, Eg2 = 1.81 eV and Eg3 = 1.99 eV. The crystal-field (ΔCF) and spin–orbit (ΔSO) splitting parameters were evaluated.
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页码：1035 / 1039
页数：4
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