Study of Structural Defects in Sapphire Ribbons using X-Ray Topography and Coherent Imaging in Synchrotron Radiation

被引：0
|
作者：
T. S. Argunova
V. G. Kohn
J.-H. Lim
V. M. Krymov
S. Yu. Martyushov
机构：
[1] Ioffe Physical—Technical Institute,
[2] Russian Academy of Sciences,undefined
[3] National Research Center “Kurchatov Institute,undefined
[4] ”,undefined
[5] Synchrotron Radiation Source “Pohang Light Source,undefined
[6] ”,undefined
[7] Technological Institute of Superhard and New Carbon Materials,undefined
来源：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2023年 / 17卷
关键词：
sapphire; Stepanov’s method; gas pores; dislocations; synchrotron radiation; phase contrast; X‑ray topography;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：S20 / S27
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