Microstructural investigation of Bi–Sr–Ca–Cu–oxide thick films on alumina substrates

被引:0
作者
J. A Alarco
A Ilushechkin
T Yamashita
A Bhargava
J Barry
I. D. R Mackinnon
机构
[1] The University of Queensland,Centre for Microscopy and Microanalysis
来源
Journal of Materials Science | 1997年 / 32卷
关键词
Partial Melting; Reaction Layer; Alumina Substrate; Silver Powder; Approximate Composition;
D O I
暂无
中图分类号
学科分类号
摘要
The microstructure of Bi–Sr–Ca–Cu–oxide (BSCCO) thick films on alumina substrates has been characterized using a combination of X-ray diffractometry, scanning electron microscopy, transmission electron microscopy of sections across the film/substrate interface and energy-dispersive X-ray spectrometry. A reaction layer formed between the BSCCO films and the alumina substrates. This chemical interaction is largely responsible for off-stoichiometry of the films and is more significant after partial melting of the films. A new phase with f c c structure, lattice parameter a = 2.45 nm and approximate composition Al3Sr2CaBi2CuOx has been identified as reaction product between BSCCO and Al2O3.
引用
收藏
页码:3759 / 3764
页数:5
相关论文
共 32 条
[1]  
Bhargava A.(1995)undefined Phys. C 247 385-undefined
[2]  
Yamashita T.(1991)undefined Appl. Phys. Lett. 59 3640-undefined
[3]  
Mackinnon I. D. R.(1992)undefined Appl. Phys. Lett. 60 2692-undefined
[4]  
Polonka J.(1993)undefined Phys. C 217 319-undefined
[5]  
Xu M.(1994)undefined Phys. C 222 111-undefined
[6]  
Li Q.(1988)undefined Appl. Phys. A 46 153-undefined
[7]  
Goldman A. I.(1990)undefined Phys. C 168 239-undefined
[8]  
Finnemore D. K.(1988)undefined Phys. C 156 325-undefined
[9]  
Hasegawa T.(undefined)undefined undefined undefined undefined-undefined
[10]  
Kitamura T.(undefined)undefined undefined undefined undefined-undefined