Genetic changes in resistance to environmental stresses by U.S. Great Plains wheat cultivars

Increased grain yield potential of newcultivars of wheat (Triticum aestivumL.) is attributed to morphological traits,but actual yield is determined mostly byenvironmental conditions. Our objectivewas to ascertain the contribution ofresistance to freezing, high temperature,drought, and defoliation to advances inyield of landmark cultivars of winter wheatin the U.S. Great Plains. Eight cultivarsthat represented significant improvementbetween 1874 and 1994 were compared bystandard electroconductivity measurementsof stability of seedling cell membranes tofreezing, high temperature, and desiccationand by grain yield and its components inplants subjected to freezing during theseedling stage and to high temperature,drought, and defoliation during maturation. Genetic changes relative to `Turkey'(introduced 1874) in stability of cellmembranes to freezing, high temperature,and desiccation were small andinconsistent. Advances in grain yieldunder control conditions were similar togains in field studies. Most cultivars hadlittle genetic change in yield afterfreezing, drought, or defoliation, probablybecause high levels of resistance areincompatible with high yield potential andthe stresses are episodic. Genetic advancein grain yield under high temperature wasphenotypically correlated with change inyield under control conditions, suggestingthat the trait is essential forproductivity because of the ubiquitousoccurrence of the stress in the region. Weconcluded that changes in resistances tofreezing, drought, and defoliationcontributed little to advances inproductivity of winter wheat in the GreatPlains, but that resistance to hightemperature was important for new cultivars.