Editorial for issue 3/2017

被引:0
|
作者
机构
来源
Advances in Data Analysis and Classification | 2017年 / 11卷
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:441 / 444
页数:3
相关论文
共 50 条
  • [41] Guest Editorial Special Issue for NCS 2017
    Yang, Ching-Nung
    Peng, Sheng-Lung
    Chang, Ruay-Shiung
    JOURNAL OF INTERNET TECHNOLOGY, 2019, 20 (04): : 1261 - 1262
  • [42] Editorial note for the special issue: ECPA 2017
    R. Kerry
    Precision Agriculture, 2019, 20 : 177 - 178
  • [43] Editorial note for the special issue: ECPA 2017
    Kerry, R.
    PRECISION AGRICULTURE, 2019, 20 (02) : 177 - 178
  • [44] Editorial IJMAV: Special issue IMAV 2017
    Moschetta, Jean-Marc
    Hattenberger, Gautier
    de Plinval, Henry
    Jardin, Thierry
    INTERNATIONAL JOURNAL OF MICRO AIR VEHICLES, 2018, 10 (03) : 243 - 243
  • [45] Guest editorial special issue for NCS 2017
    Yang, Ching-Nung
    Peng, Sheng-Lung
    Chang, Ruay-Shiung
    Journal of Internet Technology, 2019, 20 (04): : 1261 - 1262
  • [46] Guest Editorial ISCAS 2017 Special Issue
    Hall, D. A.
    Kalofonou, M.
    IEEE TRANSACTIONS ON BIOMEDICAL CIRCUITS AND SYSTEMS, 2018, 12 (03) : 449 - 451
  • [47] Guest Editorial: Special Issue on EPEC 2017
    Chung, C. Y.
    Karki, Rajesh
    Paranjape, Raman
    Yousefi, Shahram
    CANADIAN JOURNAL OF ELECTRICAL AND COMPUTER ENGINEERING-REVUE CANADIENNE DE GENIE ELECTRIQUE ET INFORMATIQUE, 2019, 42 (03): : 134 - 134
  • [48] Editorial for Cryst Rev Issue 4 of 2017
    Helliwell, John R.
    CRYSTALLOGRAPHY REVIEWS, 2017, 23 (04) : 237 - 237
  • [49] Editorial for Special Issue on OFSIS2017
    Aminossadati, Saiied M.
    Liu, Tongyu
    Amanzadeh, Moe
    MEASUREMENT, 2020, 154
  • [50] Editorial for issue 3
    Lejf Moos
    John MacBeath
    Educational Assessment, Evaluation and Accountability, 2009, 21 (3) : 191 - 193