Optical metrology embraces deep learning: keeping an open mind

被引：0
作者：
Bing Pan
机构：
[1] Beihang University,School of Aeronautic Science and Engineering
来源：
Light: Science & Applications | / 11卷
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摘要：
Optical metrology practitioners ought to embrace deep learning with an open mind, while devote continuing efforts to look for its theoretical groundwork and maintain an awareness of its limits.
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