Normalization of intensity curves in X-ray diffraction by disordered systems

被引：0

作者：

V. É. Sokol’skii

V. P. Kazimirov

V. A. Shovskii

Ya. I. Stetsiv

机构：

[1] University L’vivs’ka Politekhnika,

[2] Kiev State University,undefined

来源：

Crystallography Reports | 2000年 / 45卷

关键词：

Reflection; Diffraction Analysis; Electron Diffraction; Intensity Curve; Graphic Construction;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The application of the method of graphic construction of the background line (widely used in electron diffraction analysis of amorphous films) to the normalization of X-ray intensity curves obtained by the “ reflection” method has been considered.

引用

页码：356 / 359

页数：3