Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding

被引：0
作者：
Haiying Yuan
Jiaping Mei
Hongying Song
Kun Guo
机构：
[1] School of Electronic Information & Control Engineering,Beijing University of Technology
来源：
Journal of Electronic Testing | 2014年 / 30卷
关键词：
Compatible pattern; Pattern run-length coding; System-on-a-chip; Test data compression;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The Count Compatible Pattern Run-Length (CCPRL) coding compression method is proposed to further improve the compression ratio. Firstly, a segment of pattern in the test set is retained. Secondly, don’t-care bits are filled so as to make subsequent patterns compatible with the retained pattern for as many times as possible until it can no longer be made compatible. Thirdly, the compatible patterns are represented by symbol “0” (equal) and symbol “1” (contrary) in the codeword. In addition, the number of consecutive compatible patterns is counted and expanded into binary which indicates when the codeword ends. At last, the six largest ISCAS’89 benchmark circuits verify the proposed method, the experimental results show that the average compression ratio achieved is up to 71.73 %.
引用
收藏
页码：237 / 242
页数：5
相关论文
共 26 条
  • [1] Chandra A(2001)System-on-a-chip test-data compression and decompression architectures based on golomb codes IEEE Trans Comput Aided Des Integr Circ Syst 20 355-368
  • [2] Chakrabarty K(2003)Test data compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (fdr) codes IEEE Trans Comput 52 1076-1088
  • [3] Chandra A(2003)A unified approach to reduce soc test data volume, scan power and testing time IEEE Trans Comput Aided Des Integr Circ Syst 22 352-363
  • [4] Chakrabarty K(2008)Efficient test compression technique based on block merging IET Comput Digit Tech 2 327-335
  • [5] Chandra A(2003)An efficient test vector compression scheme using selective huffman coding IEEE Trans Comput Aided Des Integr Circ Syst 22 797-806
  • [6] Chakrabarty K(2007)Optimal selective huffman coding for test-data compression IEEE Trans Comput 56 1146-1152
  • [7] El-Maleh AH(2012)2n-pattern run-length for test data compression IEEE Trans Comput Aided Des Integr Circ Syst 31 644-648
  • [8] Jas A(2005)Rl-huffman encoding for test compression and power reduction in scan applications ACM Trans Des Autom Electron Syst 10 91-115
  • [9] Ghosh-Dastidar J(2005)Nine-coded compression technique for testing embedded cores in socs IEEE Trans VLSI Syst 13 719-731
  • [10] Ng M-E(2006)Survey of test vector compression techniques Des Test Comput IEEE 23 294-303
123