Pattern recognition of typical defects in high-voltage storage capacitors based on DC partial discharge

被引:0
作者
GuangNing Wu
ShanShan Bian
LiRen Zhou
XueQin Zhang
HanZheng Ran
ChengLong Yu
机构
[1] Southwest Jiaotong University,School of Electrical Engineering
来源
Science in China Series E: Technological Sciences | 2009年 / 52卷
关键词
high voltage; storage capacitor; partial discharge; composite insulation; DC; pattern recognition;
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中图分类号
学科分类号
摘要
High-voltage storage capacitors (hereinafter call capacitors for short) have been widely used in pulsed power technology. In accordance with the actual work conditions of capacitors, direct current partial discharge (DCPD) detection was put forward. The whole test system was based on the impedance balance circuit characterized by good configuration and anti-interference ability. Through DCPD detection on capacitors which contained four typical defects respectively, test results revealed that DCPD signals could well reflect the state of capacitor insulation. DCPD distribution spectra of capacitors containing four typical defects were obviously different. Defects in capacitors could be exactly judged by computer-aided pattern recognition based on support vector machine (SVM).
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页码:3729 / 3735
页数:6
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