In-plane strains measurement by using the electronic speckle pattern interferometry

被引：0
|
作者：
Koung-Suk Kim
Hyun-Chul Jung
Ki-Soo Kang
Jong-Kook Lee
Soon-Suck Jang
Chung-Ki Hong
机构：
[1] Chosun University,Department of Mechanical design Engineering
[2] Chosun University,Department of Materials Engineering
[3] Chosun University,Department of Control and Measurement Engineering
[4] Pohang Institute of Science and Technology,Department of Physics
来源：
KSME International Journal | 1998年 / 12卷
关键词：
Coherent Light; Electronic Speckle Pattern Interferometry (ESPI); Fringe Pattern; Image Processing;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Two-dimensional in-plane displacements and strains are measured using an electronic speckle pattern interferometry (ESPI) system based on the dual beam speckle interferometric method. Different types of specimens are used: a flat plate, a cracked-plate, and plate with a central hole of 12 mm diameter. Two-dimensional fringes obtained from real-time images are analyzed by an image analyser. The values of in-plane strains obtained by the ESPI technique show high accuracy compared with those measured by strain gages.
引用
收藏
页码：215 / 222
页数：7
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