Acquisition of optimal operating temperature for epitaxial Si:P blocked-impurity-band detector based on temperature-dependent characteristics investigation

被引:0
作者
Bingbing Wang
Xiaodong Wang
Xiaoyao Chen
Liwei Hou
Wei Xie
Ming Pan
机构
[1] No. 50 Research Institute of China Electronics Technology Group Corporation,Laboratory of Advanced Material
[2] Fudan University,undefined
来源
Optical and Quantum Electronics | 2016年 / 48卷
关键词
Dark Current; Background current; Black-body responsivity; Signal-to-noise ratio; Blocked-impurity-band detector;
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中图分类号
学科分类号
摘要
The structure and fabrication of epitaxial Si:P blocked-impurity-band detector have been presented in detail. Experimental testing systems were constructed. The Characteristics of dark current, background current, black-body responsivity and signal-to-noise ratio have been investigated as functions of bias voltage and temperature. It is found that the optimal operating temperature for the epitaxial Si:P BIB detector is about 20 K at bias voltage below 2 V.
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