Nanoscale insight into the statics and dynamics of polarization behavior in thin film ferroelectric capacitors

被引：0
作者：
A. Gruverman
机构：
[1] University of Nebraska,Department of Physics and Astronomy
来源：
Journal of Materials Science | 2009年 / 44卷
关键词：
Domain Wall; Domain Wall Motion; Wall Velocity; Piezoresponse Force Microscopy; Domain Wall Velocity;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
In this study, we review recent advances in PFM studies of micrometer scale ferroelectric capacitors, summarize the experimental PFM-based approach to investigation of fast switching processes, illustrate what information can be obtained from PFM experiments on domains kinetics, and delineate the scaling effect on polarization reversal mechanism. Particular attention is given to PFM studies of mechanical stress effect on polarization stability.
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页码：5182 / 5188
页数：6
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