Broad band application of combined instrumental photon and neutron activation analysis

被引:0
作者
W. Görner
A. Berger
K. H. Ecker
O. Haase
M. Hedrich
Chr. Segebade
G. Weidemann
G. Wermann
机构
[1] Federal Institute for Materials Research and Testing (BAM),
来源
Journal of Radioanalytical and Nuclear Chemistry | 2001年 / 248卷
关键词
Copper; Silicon; Physical Chemistry; Inorganic Chemistry; Polyethylene;
D O I
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中图分类号
学科分类号
摘要
The use of INAA and IPAA is illustrated by several applications (Zn-traces in Cu, neutron doping of Zn in copper, implanted Sb in silicon, trace elements in sediment material and polyethylene). The two methods are used to complement or to cross-check each other. Validation by IDA-TIMS was performed in the case of neutron doping and turned out to be a valuable support. Even developed routines of activation analysis need improvement. Two technical solutions, the high energy photon screen (HEPS) and a twin detector assembly, are dealt with in detail.
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页码:45 / 52
页数:7
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