Evaluation of Changes in Plastic Yield Parameters of Titanium CP-2 using Electrical Resistivity Measurements

The paper focuses on the connection between the changes in electrical resistivity and plastic yield parameters - hardening coefficient and yield stress - of Titanium CP-2 specimens subjected to quasi-static loading-unloading cycles. Such a cross-property connection possible due is made to all the mentioned properties being controlled by the same microstructural parameter – dislocation density that increases during each loading-unloading cycle. Electrical resistivity has been measured at the end of each cycle and plastic yield parameters have been obtained from the stress-strain curves. The microstructural changes were also evaluated using Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). Experimental measurements are in a good agreement with the theoretical estimates.