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Mao W.(1995)A Practical Current Sensing Technique for IDDQ Testing IEEE Trans. VLSI Systems 3 302-310
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Argüelle J.(undefined)undefined undefined undefined undefined-undefined
[6]
Martinez M.(undefined)undefined undefined undefined undefined-undefined
[7]
Bracho S.(undefined)undefined undefined undefined undefined-undefined
[8]
Shen T.-L.(undefined)undefined undefined undefined undefined-undefined
[9]
Daly J.C.(undefined)undefined undefined undefined undefined-undefined
[10]
Lo J.-C.(undefined)undefined undefined undefined undefined-undefined