Design of Plane-Symmetric Low F-number Reflective System Based on Perturbation Aberration Model

被引:0
|
作者
Takayuki Nakano
Yasuhisa Tamagawa
机构
[1] Mitsubishi Electric Corporation,Information Technology R&D Center
来源
Optical Review | 2007年 / 14卷
关键词
design method; reflective system; off-axis; plane-symmetry; aberration; perturbation; astigmatism;
D O I
暂无
中图分类号
学科分类号
摘要
All-reflective optical systems have theoretically no chromatic aberration and are suitable for wide spectral application, but co-axial reflective systems are difficult to design as low F-number optical systems. In this paper, the aberration of plane-symmetric optical systems with low F-number is analyzed based on the wavefront derived from optical path length. Up to third-order aberrations are classified into three categories by their characteristics. The reduction method of the dominant aberration, astigmatism-like aberration, is proposed. In the method, the Gauss image plane is modeled by means of a simplified mirror surface with third-order approximation. Because the system is plane-symmetric, symmetric cross section and asymmetric cross section are modelled differently. The design example of a three-mirror system with F/2 is shown.
引用
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页码:376 / 383
页数:7
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