Ultrathin Barrier InAlN/GaN Heterostructures for HEMTs

被引:0
|
作者
A. V. Sakharov
W. V. Lundin
E. E. Zavarin
D. A. Zakheim
S. O. Usov
A. F. Tsatsulnikov
M. A. Yagovkina
P. E. Sim
O. I. Demchenko
N. Y. Kurbanova
L. E. Velikovskiy
机构
[1] Ioffe Institute,
[2] Submicron Heterostructures for Microelectronics,undefined
[3] Research and Engineering Center,undefined
[4] Russian Academy of Sciences,undefined
[5] Tomsk State University,undefined
来源
Semiconductors | 2018年 / 52卷
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:1843 / 1845
页数:2
相关论文
共 50 条
  • [1] Ultrathin Barrier InAlN/GaN Heterostructures for HEMTs
    Sakharov, A. V.
    Lundin, W. V.
    Zavarin, E. E.
    Zakheim, D. A.
    Usov, S. O.
    Tsatsulnikov, A. F.
    Yagovkina, M. A.
    Sim, P. E.
    Demchenko, O. I.
    Kurbanova, N. Y.
    Velikovskiy, L. E.
    SEMICONDUCTORS, 2018, 52 (14) : 1843 - 1845
  • [2] Barrier-layer scaling of InAlN/GaN HEMTs
    Medjdoub, F.
    Alomari, M.
    Carlin, J. -F.
    Gonschorek, M.
    Feltin, E.
    Py, M. A.
    Grandjean, N.
    Kohn, E.
    IEEE ELECTRON DEVICE LETTERS, 2008, 29 (05) : 422 - 425
  • [3] Ultrathin InAlN/GaN heterostructures with high electron mobility
    Fang, Y. L.
    Feng, Z. H.
    Yin, J. Y.
    Zhang, Z. R.
    Lv, Y. J.
    Dun, S. B.
    Liu, B.
    Li, C. M.
    Cai, S. J.
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2015, 252 (05): : 1006 - 1010
  • [4] InAlN - A new barrier material for GaN-based HEMTs
    Kohn, Erhard
    Medjdoub, Farid
    PROCEEDINGS OF THE 2007 INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES: IWPSD-2007, 2007, : 311 - 316
  • [5] Thermal stability of 5 nm barrier InAlN/GaN HEMTs
    Medjdoub, F.
    Alomari, M.
    Carlin, J. -F.
    Gonschorek, M.
    Carlin, J. -F.
    Feltin, E.
    Py, M. A.
    Grandjean, N.
    Kohn, E.
    2007 INTERNATIONAL SEMICONDUCTOR DEVICE RESEARCH SYMPOSIUM, VOLS 1 AND 2, 2007, : 320 - +
  • [6] 300-GHz InAlN/GaN HEMTs With InGaN Back Barrier
    Lee, Dong Seup
    Gao, Xiang
    Guo, Shiping
    Kopp, David
    Fay, Patrick
    Palacios, Tomas
    IEEE ELECTRON DEVICE LETTERS, 2011, 32 (11) : 1525 - 1527
  • [7] Ultrathin Body InAlN/GaN HEMTs for High-Temperature (600 °C) Electronics
    Herfurth, Patrick
    Maier, David
    Lugani, Lorenzo
    Carlin, Jean-Francois
    Roesch, Rudolf
    Men, Yakiv
    Grandjean, Nicolas
    Kohn, Erhard
    IEEE ELECTRON DEVICE LETTERS, 2013, 34 (04) : 496 - 498
  • [8] Impact of GaN Channel Scaling in InAlN/GaN HEMTs
    Lee, Dong Seup
    Lu, Bin
    Azize, Mohamad
    Gao, Xiang
    Guo, Shiping
    Kopp, David
    Fay, Patrick
    Palacios, Tomas
    2011 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2011,
  • [9] Epitaxial growth of GaN/AlN/InAlN heterostructures for HEMTs in horizontal MOCVD reactors with different designs
    A. F. Tsatsulnikov
    W. V. Lundin
    A. V. Sakharov
    E. E. Zavarin
    S. O. Usov
    A. E. Nikolaev
    M. A. Yagovkina
    V. M. Ustinov
    N. A. Cherkashin
    Semiconductors, 2016, 50 : 1241 - 1247
  • [10] Proposal and Performance Analysis of Normally Off n++ GaN/InAlN/AlN/GaN HEMTs With 1-nm-Thick InAlN Barrier
    Kuzmik, Jan
    Ostermaier, Clemens
    Pozzovivo, G.
    Basnar, Bernhard
    Schrenk, Werner
    Carlin, Jean-Francois
    Gonschorek, M.
    Feltin, Eric
    Grandjean, Nicolas
    Douvry, Y.
    Gaquiere, Christophe
    De Jaeger, Jean-Claude
    Cico, K.
    Froehlich, Karol
    Skriniarova, J.
    Kovac, Jaroslav
    Strasser, Gottfried
    Pogany, Dionyz
    Gornik, Erich
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2010, 57 (09) : 2144 - 2154