Investigation of a new fracture mechanics specimen for thin film adhesion measurement

被引:0
|
作者
Maarten P. de Boer
Michael Kriese
William W. Gerberich
机构
[1] University of Minnesota,Department of Chemical Engineering and Materials Science
[2] Present address: Sandia National Laboratory,undefined
[3] Department 1114,undefined
来源
Journal of Materials Research | 1997年 / 12卷
关键词
D O I
暂无
中图分类号
学科分类号
摘要
We have investigated mechanical probing of a precracked fine line structure as a new type of thin film fracture mechanics specimen. An idealized mechanics analysis is first presented. Experimentally, two types of precracks are formed. A thin carbon layer to which other layers weakly adhere creates a “processed precrack” by integrated circuit processing techniques. An “indented processed precrack” is formed by precision alignment of a sharp microwedge. The processed precrack is found to reduce the critical tangential load by 50% from a non-precracked line, while the indented processed precrack lowers the load by 200%. From this, a reasonable value of adhesion may be directly calculated. Crack path behavior is observed to depend on strength of the interface. In the case of a weak interface, the crack remains in the interface as it extends. For a strong interface, it kinks into the substrate if the crack is initially short, but remains in the interface if it is initially long. Given the experimental evidence, the mechanics are slightly modified to quantitatively model the experimental data.
引用
收藏
页码:2673 / 2685
页数:12
相关论文
共 50 条
  • [1] Investigation of a new fracture mechanics specimen for thin film adhesion measurement
    deBoer, MP
    Kriese, M
    Gerberich, WW
    JOURNAL OF MATERIALS RESEARCH, 1997, 12 (10) : 2673 - 2685
  • [2] FRACTURE-MECHANICS FOR THIN-FILM ADHESION
    THOULESS, MD
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1994, 38 (04) : 367 - 377
  • [3] MEASUREMENT OF THIN-FILM ADHESION
    HULL, TR
    COLLIGON, JS
    HILL, AE
    VACUUM, 1987, 37 (3-4) : 327 - 330
  • [4] QUANTITATIVE MEASUREMENT OF THIN FILM ADHESION FORCE
    Tsai, Li-Chih
    Rezaee, Maysam
    Haider, Muhammad Istiaque
    Yazdi, Armin
    Salowitz, Nathan P.
    PREOCEEDINGS OF THE ASME CONFERENCE ON SMART MATERIALS, ADAPTIVE STRUCTURES AND INTELLIGENT SYSTEMS, 2019, 2020,
  • [5] Recent developments in thin film adhesion measurement
    Cordill, MJ
    Bahr, DF
    Moody, NR
    Gerberich, WW
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2004, 4 (02) : 163 - 168
  • [6] Proposal of new Pipe-Ring specimen for fracture mechanics
    Damjanovic, Darko
    Kozak, Drazan
    Gubeljak, Nenad
    Tropsa, Vlado
    INTERNATIONAL CONFERENCE ON MANUFACTURING ENGINEERING AND MATERIALS, ICMEM 2016, 2016, 149 : 33 - 39
  • [7] Multivariant measurement for thin film adhesion as a function of temperature and thin film thickness
    Chiang, MYM
    Song, R
    Karim, A
    Amis, EJ
    NANOTECH 2003, VOL 3, 2003, : 254 - 257
  • [8] SPECIMEN FOR FRACTURE MECHANICS STUDIES ON GLASS
    JANSSEN, C
    REVUE DE PHYSIQUE APPLIQUEE, 1977, 12 (05): : 803 - 803
  • [9] The mechanics and physics of thin film decohesion and its measurement
    Bagchi, A
    Evans, AG
    INTERFACE SCIENCE, 1996, 3 (03) : 169 - 193
  • [10] FRACTURE MECHANICS TEST SPECIMEN DESIGN
    EGAN, GR
    METAL CONSTRUCTION AND BRITISH WELDING JOURNAL, 1970, 2 (06): : 255 - &