Nonlinear ellipse rotation measurements in optical thick samples

被引：0
作者：
M. L. Miguez
E. C. Barbano
J. A. Coura
S. C. Zílio
L. Misoguti
机构：
[1] Universidade de São Paulo,Instituto de Física de São Carlos
来源：
Applied Physics B | 2015年 / 120卷
关键词：
Beam Waist; Thick Sample; Optical Glass; Nonlinear Refractive Index; Laser Irradiance;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Nonlinear refractive indices of several optical glasses were measured by means of the nonlinear ellipse rotation method in a tightly focused laser beam condition, leading to the improvement of the spatial resolution which allows probing the local refractive nonlinearity with better accuracy. The use of a short focal length results in a Rayleigh range shorter than the sample thickness, and this feature can be explored to measure two stacked samples in a single run. In this way, it is possible to simultaneously probe a reference and an unknown sample, improving significantly the refractive nonlinearity determination. Several optical glasses were characterized by this method using fused silica as reference.
引用
收藏
页码：653 / 658
页数：5
相关论文
共 72 条
  • [1] Vogel EM(1989)undefined J. Am. Ceram. Soc. 72 719-undefined
  • [2] Yan XQ(2012)undefined J. Opt. Soc. Am. B 29 2721-undefined
  • [3] Liu ZB(2004)undefined IEEE J. Sel. Top. Quantum Electron. 10 1164-undefined
  • [4] Chen YS(2012)undefined Opt. Mater. Express 2 1776-undefined
  • [5] Tian JG(2013)undefined Opt. Lett. 38 2206-undefined
  • [6] Nikolakakos IP(2013)undefined Opt. Lett. 38 3518-undefined
  • [7] Major A(2014)undefined Optica 1 436-undefined
  • [8] Aitchison JS(1990)undefined IEEE J. Quantum Electron. 26 760-undefined
  • [9] Smith PWE(2008)undefined J. Opt. Soc. Am. B 25 1738-undefined
  • [10] Ferdinandus MR(1998)undefined Appl. Opt. 37 546-undefined
12345678