Use of Special Devices for the X-Ray Interferometric Investigation of Structural Imperfections in Single Crystals

被引：0
|
作者：
H. R. Drmeyan
M. S. Vasilyan
机构：
[1] Institute of Applied Problems of Physics,
[2] National Academy of Sciences of the Republic of Armenia,undefined
[3] Nalbandyan State University of Shirak,undefined
来源：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2023年 / 17卷
关键词：
multiple interferometers; moiré topogram; crystal-block bending; structural defects; scratch; dislocation generation; stress field;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：1028 / 1033
页数：5
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