How to be sure a faulty system does not always appear healthy?Fault manifestability analysis for discrete event and timed systems
被引:0
|
作者:
Philippe Dague
论文数: 0引用数: 0
h-index: 0
机构:Inria,CentraleSupélec
Philippe Dague
Lulu He
论文数: 0引用数: 0
h-index: 0
机构:Inria,CentraleSupélec
Lulu He
Lina Ye
论文数: 0引用数: 0
h-index: 0
机构:Inria,CentraleSupélec
Lina Ye
机构:
[1] Inria,CentraleSupélec
[2] LSV,undefined
[3] CNRS,undefined
[4] ENS Paris-Saclay,undefined
[5] Univ. Paris-Saclay,undefined
[6] LRI,undefined
[7] CNRS,undefined
[8] Univ. Paris-Saclay,undefined
[9] Univ. Paris-Saclay,undefined
来源:
Innovations in Systems and Software Engineering
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2020年
/
16卷
关键词:
Model-based diagnosis;
Diagnosability and manifestability;
Bounded model checking;
SMT;
Timed automata;
Real-time systems;
D O I:
暂无
中图分类号:
学科分类号:
摘要:
Fault diagnosability (allowing one to determine with certainty whether a given fault has effectively occurred based on the available observations) is a crucial and challenging property in complex system automatic control, which generally requires a high number of sensors, increasing the system cost, since it is quite a strong property. In this paper, we analyze a new system property called manifestability, that is a weaker requirement on system observations for having a chance to identify on-line faults: that a faulty system cannot always appear healthy. We propose an algorithm with PSPACE complexity to automatically verify it for finite automata, and prove that the problem of manifestability verification itself is PSPACE-complete. The experimental results show the feasibility of our algorithm from a practical point of view. Then, we extend our approach to verify manifestability of real-time systems modeled by timed automata, proving that it is undecidable in general but under some restricted conditions it becomes PSPACE-complete. Finally, we encode this property into an SMT formula, whose satisfiability witnesses manifestability, before presenting experimental results showing the scalability of our approach.
机构:
Univ Paris Saclay, ENS Paris Saclay, CNRS, Inria,LSV, Gif Sur Yvette, France
Univ Paris Saclay, CNRS, LRI, Gif Sur Yvette, FranceUniv Paris Saclay, ENS Paris Saclay, CNRS, Inria,LSV, Gif Sur Yvette, France
Dague, Philippe
He, Lulu
论文数: 0引用数: 0
h-index: 0
机构:
Univ Paris Saclay, CNRS, LRI, Gif Sur Yvette, FranceUniv Paris Saclay, ENS Paris Saclay, CNRS, Inria,LSV, Gif Sur Yvette, France
He, Lulu
Ye, Lina
论文数: 0引用数: 0
h-index: 0
机构:
Univ Paris Saclay, ENS Paris Saclay, CNRS, Inria,LSV, Gif Sur Yvette, France
Univ Paris Saclay, CNRS, LRI, Gif Sur Yvette, France
Univ Paris Saclay, Cent Supelec, Gif Sur Yvette, Paris, FranceUniv Paris Saclay, ENS Paris Saclay, CNRS, Inria,LSV, Gif Sur Yvette, France