Mitigating the Effects of Charged Particle Strikes on TES Arrays for Exotic Atom X-ray Experiments

被引：0

作者：

H. Tatsuno

D. A. Bennett

W. B. Doriese

M. S. Durkin

J. W. Fowler

J. D. Gard

T. Hashimoto

R. Hayakawa

T. Hayashi

G. C. Hilton

Y. Ichinohe

H. Noda

G. C. O’Neil

S. Okada

C. D. Reintsema

D. R. Schmidt

D. S. Swetz

J. N. Ullom

S. Yamada

机构：

[1] Tokyo Metropolitan University,Department of Physics

[2] National Institute of Standards and Technology,Department of High Energy Astrophysics, Institute of Space and Astronautical Science (ISAS)

[3] Japan Atomic Energy Agency (JAEA),Department of Physics

[4] Japan Aerospace Exploration Agency (JAXA),Department of Earth and Space Science

[5] Rikkyo University,Atomic, Molecular and Optical Physics Laboratory

[6] Osaka University,undefined

[7] RIKEN,undefined

来源：

Journal of Low Temperature Physics | 2020年 / 200卷

关键词：

Transition-edge sensor; Exotic atom; X-ray spectroscopy; Thermal crosstalk; Energy calibration;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Exotic atom experiments place transition-edge sensor (TES) microcalorimeter arrays in a high-energy charged particle-rich environment. When a high-energy charged particle passes through the silicon substrate of a TES array, a large amount of energy is deposited and small pulses are generated across multiple pixels in the TES array due to thermal crosstalk. We have developed analysis techniques to assess and reduce the effects of charged particle events on exotic atom X-ray measurements. Using this technique, the high-energy and low-energy components of the X-ray peaks due to pileup are eliminated, improving the energy resolution from 6.6 to 5.7 eV at 6.9 keV.

引用

页码：247 / 254

页数：7

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