Nanoscale investigation of deformation characteristics in a polycrystalline silicon carbide

被引:0
|
作者
D. Zhang
L. G. Zhao
A. Roy
Y.-L. Chiu
机构
[1] Loughborough University,Wolfson School of Mechanical, Electrical and Manufacturing Engineering
[2] University of Birmingham,School of Metallurgy and Materials
来源
Journal of the Australian Ceramic Society | 2020年 / 56卷
关键词
Silicon carbide; Nanoscale deformation; Focused ion beam; Irradiation damage; Fracture toughness;
D O I
暂无
中图分类号
学科分类号
摘要
In this paper, we study the mechanical behaviour of silicon carbide at the nanoscale, with a focus on the effects of grain orientation and high-dose irradiation. Grain orientation effect was studied through nanoindentation with the aid of scanning electron microscopy (SEM) and EBSD (electron backscatter diffraction) analyses. Mechanical properties such as hardness, elastic modulus and fracture toughness were assessed for different grain orientations. Increased plasticity and fracture toughness were observed during indentations on crystallographic planes which favour dislocation movement. In addition, for SiC subjected to irradiation, increases in hardness and embrittlement were observed in nanoindentations at lower imposed loads, whereas a decrease in hardness and an increase in toughness were obtained in nanoindentations at higher loads. Transmission electron microscopy (TEM) analyses revealed that the mechanical response observed at a shallow indentation depth was due to Ga ion implantation, which hardened and embrittled the surface layer of the material. With an increased indentation depth, irradiation-induced amorphization led to a decrease in hardness and an increase in fracture toughness of the material.
引用
收藏
页码:951 / 967
页数:16
相关论文
共 50 条
  • [41] Mechanical characteristics of microwave sintered silicon carbide
    Mandal, S
    Seal, A
    Dalui, SK
    Dey, AK
    Ghatak, S
    Mukhopadhyay, AK
    BULLETIN OF MATERIALS SCIENCE, 2001, 24 (02) : 121 - 124
  • [42] Spectral and adsorption characteristics of plasmachemical silicon carbide
    Belogorokhov, A. I.
    Tutorskii, I. A.
    Storozhenko, P. A.
    Ishchenko, A. A.
    Bukanova, E. F.
    Es'kova, E. V.
    Mustafina, M. R.
    DOKLADY PHYSICAL CHEMISTRY, 2006, 410 (1) : 272 - 274
  • [43] Bend deformation behavior of silicon carbide reticulated porous ceramics
    Zhu, Xinwen
    Sakka, Yoshio
    Tan, Shouhong
    Jiang, Dongliang
    PROGRESS IN POWDER METALLURGY, PTS 1 AND 2, 2007, 534-536 : 941 - +
  • [44] Polycrystalline silicon carbide film deposition using monomethylsilane and hydrogen chloride gases
    Habuka, H.
    Watanabe, M.
    Nishida, M.
    Sekiguchi, T.
    SURFACE & COATINGS TECHNOLOGY, 2007, 201 (22-23) : 8961 - 8965
  • [45] Molecular Dynamics Simulation of Nanomachining Mechanism between Monocrystalline and Polycrystalline Silicon Carbide
    Liu, Bing
    Yang, Haijie
    Xu, Zongwei
    Wang, Dongai
    Ji, Hongwei
    ADVANCED THEORY AND SIMULATIONS, 2021, 4 (08)
  • [46] Polycrystalline silicon carbide film deposition using monomethylsilane and hydrogen chloride gases
    Habuka, Hitoshi
    Watanabe, Mayuka
    Miura, Yutaka
    Nishida, Mikiya
    Sekiguchi, Takashi
    JOURNAL OF CRYSTAL GROWTH, 2007, 300 (02) : 374 - 381
  • [47] Nickel and platinum ohmic contacts to polycrystalline 3C-silicon carbide
    Zhang, Jingchun
    Howe, Roger T.
    Maboudian, Roya
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2007, 139 (2-3): : 235 - 239
  • [48] Polycrystalline silicon wafer with columnar grain structure grown directly on silicon carbide coated graphite substrate
    Jin-Seok Lee
    Bo-Yun Jang
    Joon-Soo Kim
    Young-Soo Ahn
    Journal of Electroceramics, 2013, 30 : 51 - 54
  • [49] Polycrystalline silicon wafer with columnar grain structure grown directly on silicon carbide coated graphite substrate
    Lee, Jin-Seok
    Jang, Bo-Yun
    Kim, Joon-Soo
    Ahn, Young-Soo
    JOURNAL OF ELECTROCERAMICS, 2013, 30 (1-2) : 51 - 54
  • [50] Wear-Resistant Nanoscale Silicon Carbide Tips for Scanning Probe Applications
    Lantz, Mark A.
    Gotsmann, Bernd
    Jaroenapibal, Papot
    Jacobs, Tevis D. B.
    O'Connor, Sean D.
    Sridharan, Kumar
    Carpick, Robert W.
    ADVANCED FUNCTIONAL MATERIALS, 2012, 22 (08) : 1639 - 1645