Comparison of single-event upset generated by heavy ion and pulsed laser

被引：0
作者：
Bin Liang
Ruiqiang Song
Jianwei Han
Yaqing Chi
Rui Chen
Chunmei Hu
Jianjun Chen
Yingqi Ma
Shipeng Shangguan
机构：
[1] National University of Defense Technology,College of Computer
[2] Chinese Academy of Sciences,Center for Space Science and Applied Research
来源：
Science China Information Sciences | 2017年 / 60卷
关键词：
single-event upset; charge sharing; cross sections; heavy ion; pulsed laser;
D O I：
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学科分类号：
摘要：
Single-event upset (SEU) is investigated using heavy ion and pulsed laser. The measured SEU cross sections of D and DICE flip-flops are compared. Measurement results indicate pulsed laser is capable of inducing similar SEU to those induced by heavy ion. 3D-TCAD simulation is performed to investigate the factors to impact pulsed laser induced SEU. Simulation results show that the beam spot size significantly impacts SEU cross sections in both low and high laser energy while the variation of the equivalent LET only impacts SEU cross sections in the low laser energy.
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