Standardless PIXE analysis of thick biomineral structures

被引:0
作者
E. A. Preoteasa
Rodica Georgescu
C. Ciortea
Daniela Fluerasu
Livia Harangus
Andreea Iordan
Feride Severcan
Handan Boyar
Elena Preoteasa
I. Piticu
D. Pantelica
Vl Gheordunescu
机构
[1] Horia Hulubei National Institute for Physics and Nuclear Engineering,Department of Biology, Faculty of Science
[2] Middle East Technical University,undefined
[3] Helident Dental Surgery Ltd.,undefined
[4] Institute of Biochemistry,undefined
来源
Analytical and Bioanalytical Chemistry | 2004年 / 379卷
关键词
PIXE; Trace elements; Biomaterials; Dental enamel; Bone; Multivariate statistics;
D O I
暂无
中图分类号
学科分类号
摘要
The particle-induced X-ray emission (PIXE) of thick biomineral targets provides pertinent surface analysis, but if good reference materials are missing then complementary approaches are required to handle the matrix effects. This is illustrated by our results from qualitative and semiquantitative analysis of biomaterials and calcified tissues in which PIXE usually detected up to 20 elements with Z > 14 per sample, many at trace levels. Relative concentrations allow the classification of dental composites according to the mean Z and by multivariate statistics. In femur bones from streptozotocin-induced diabetic rats, trace element changes showed high individual variability but correlated to each other, and multivariate statistics improved discrimination of abnormal pathology. Changes on the in vitro demineralization of dental enamel suggested that a dissolution of Ca compounds in the outermost layer results in the uncovering of deeper layers containing higher trace element levels. Thus, in spite of significant limitations, standardless PIXE analysis of thick biomineral samples together with proper additional procedures can provide relevant information in biomedical research.
引用
收藏
页码:825 / 841
页数:16
相关论文
共 50 条
  • [1] Standardless PIXE analysis of thick biomineral structures
    Preoteasa, EA
    Georgescu, R
    Ciortea, C
    Fluerasu, D
    Harangus, L
    Iordan, A
    Severcan, F
    Boyar, H
    Preoteasa, E
    Piticu, I
    Pantelica, D
    Gheordunescu, V
    ANALYTICAL AND BIOANALYTICAL CHEMISTRY, 2004, 379 (5-6) : 825 - 841
  • [2] Thick-target PIXE analysis of trace elements in wood incoming to a pulp mill
    Saarela, KE
    Harju, L
    Lill, JO
    Rajander, J
    Lindroos, A
    Heselius, SJ
    Saari, K
    HOLZFORSCHUNG, 2002, 56 (04) : 380 - 387
  • [3] ANALYSIS OF MEMBRANE FILTERS AND THICK FLY-ASH SAMPLES BY PIXE
    HAVRANEK, V
    HNATOWICZ, V
    KVITEK, J
    OBRUSNIK, I
    BIOLOGICAL TRACE ELEMENT RESEARCH, 1994, 43-5 : 185 - 193
  • [4] High Energy PIXE at the ARRONAX Facility for Multi Elemental Analysis of Thick Samples
    Koumeir, C.
    Haddad, F.
    Metivier, V.
    Servagent, N.
    de la Bernardie, X.
    Garrido, E.
    Ragheb, D.
    APPLICATIONS OF NUCLEAR TECHNIQUES: ELEVENTH INTERNATIONAL CONFERENCE, 2011, 1412
  • [5] Thick-target PIXE analysis of chromium, copper and arsenic impregnated lumber
    Saarela, KE
    Harju, L
    Lill, JO
    Rajander, J
    Lindroos, A
    Heselius, SJ
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 150 (1-4) : 234 - 239
  • [6] Analysis of composites for restorative dentistry by PIXE, XRF and ERDA
    Preoteasa, EA
    Ciortea, C
    Constantinescu, B
    Fluerasu, D
    Enescu, SE
    Pantelica, D
    Negoita, F
    Preoteasa, E
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2002, 189 : 426 - 430
  • [7] PIXE ANALYSIS OF SOME VEGETABLE SPECIES
    Pantelica, Ana
    Ene, Antoaneta
    Gugiu, M.
    Ciortea, C.
    Constantinescu, O.
    ROMANIAN REPORTS IN PHYSICS, 2011, 63 (04) : 997 - 1008
  • [8] Trace elements in termites by PIXE analysis
    Yoshimura, T
    Kagemori, N
    Kawai, S
    Sera, K
    Futatsugawa, S
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2002, 189 : 450 - 453
  • [9] PIXE and XRF analysis of honey samples
    Braziewicz, J
    Fijal, I
    Czyzewski, T
    Jaskóla, M
    Korman, A
    Banas, D
    Kubala-Kukus, A
    Majewska, U
    Zemlo, L
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2002, 187 (02) : 231 - 237
  • [10] Thick-target correction in PIXE for randomly inhomogeneous samples
    Sjöland, KA
    Munnik, F
    Wätjen, U
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 161 (161) : 264 - 268