Quantitative analysis of printed nanostructured networks using high-resolution 3D FIB-SEM nanotomography

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作者
Cian Gabbett
Luke Doolan
Kevin Synnatschke
Laura Gambini
Emmet Coleman
Adam G. Kelly
Shixin Liu
Eoin Caffrey
Jose Munuera
Catriona Murphy
Stefano Sanvito
Lewys Jones
Jonathan N. Coleman
机构
[1] Trinity College Dublin,School of Physics, CRANN and AMBER Research Centres
[2] University of Oviedo,Department of Physics, Faculty of Sciences
[3] C/ Leopoldo Calvo Sotelo,undefined
[4] 18,undefined
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Nature Communications | / 15卷
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摘要
Networks of solution-processed nanomaterials are becoming increasingly important across applications in electronics, sensing and energy storage/generation. Although the physical properties of these devices are often completely dominated by network morphology, the network structure itself remains difficult to interrogate. Here, we utilise focused ion beam – scanning electron microscopy nanotomography (FIB-SEM-NT) to quantitatively characterise the morphology of printed nanostructured networks and their devices using nanometre-resolution 3D images. The influence of nanosheet/nanowire size on network structure in printed films of graphene, WS2 and silver nanosheets (AgNSs), as well as networks of silver nanowires (AgNWs), is investigated. We present a comprehensive toolkit to extract morphological characteristics including network porosity, tortuosity, specific surface area, pore dimensions and nanosheet orientation, which we link to network resistivity. By extending this technique to interrogate the structure and interfaces within printed vertical heterostacks, we demonstrate the potential of this technique for device characterisation and optimisation.
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