Microstructural characterization of ultrafine-grain interstitial-free steel by X-ray diffraction line profile analysis

被引:0
|
作者
Apu Sarkar
Ayan Bhowmik
Satyam Suwas
机构
[1] Indian Institute of Science,Department of Materials Engineering
来源
Applied Physics A | 2009年 / 94卷
关键词
61.05.Cp; 61.72.-y; 61.72.Dd;
D O I
暂无
中图分类号
学科分类号
摘要
This paper highlights the microstructural features of commercially available interstitial free (IF) steel specimens deformed by equal channel angular pressing (ECAP) up to four passes following the route A. The microstructure of the samples was studied by different techniques of X-ray diffraction peak profile analysis as a function of strain (ε). It was found that the crystallite size is reduced substantially already at ε=2.3 and it does not change significantly during further deformation. At the same time, the dislocation density increases gradually up to ε=4.6. The dislocation densities estimated from X-ray diffraction study are found to correlate very well with the experimentally obtained yield strength of the samples.
引用
收藏
页码:943 / 948
页数:5
相关论文
共 50 条
  • [1] Microstructural characterization of ultrafine-grain interstitial-free steel by X-ray diffraction line profile analysis
    Sarkar, Apu
    Bhowmik, Ayan
    Suwas, Satyam
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2009, 94 (04): : 943 - 948
  • [2] Characterization of Irradiated Microstructure by X-Ray Diffraction Line Profile Analysis
    A. Sarkar
    P. Mukherjee
    P. Barat
    Metallurgical and Materials Transactions A, 2008, 39 : 1602 - 1609
  • [3] Characterization of irradiated microstructure by X-ray diffraction line profile analysis
    Sarkar, A.
    Mukherjee, P.
    Barat, P.
    METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2008, 39A (07): : 1602 - 1609
  • [4] Characterization of microstructures by x-ray diffraction line profile analysis III: Applications of line profile analysis
    Nishida M.
    Hashimoto T.
    Kumagai M.
    Zairyo/Journal of the Society of Materials Science, Japan, 2020, 69 (05) : 421 - 426
  • [5] On the Microstructural Stability of Ultrafine-Grained Interstitial-Free Steel under Cyclic Loading
    T. Niendorf
    D. Canadinc
    H.J. Maier
    I. Karaman
    Metallurgical and Materials Transactions A, 2007, 38 : 1946 - 1955
  • [6] On the microstructural stability of ultrafine-grained interstitial-free steel under cyclic loading
    Niendorf, T.
    Canadinc, D.
    Maier, H. J.
    Karaman, I.
    METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2007, 38A (09): : 1946 - 1955
  • [7] Characterization of microstructures by X-ray diffraction line profile analysis ⅱ.: Line profile analysis using synchrotron radiation
    Shobu T.
    Shiro A.
    Yoshida Y.
    Zairyo/Journal of the Society of Materials Science, Japan, 2020, 69 (04) : 343 - 347
  • [8] X-ray diffraction line profile analysis: A microstructural study in polymorphic TiO2
    Santos-Aguilar, Pamela
    Contreras-Torres, Flavio F.
    MATERIALS TODAY-PROCEEDINGS, 2019, 13 : 420 - 427
  • [9] Microstructural characterization of recrystallised Zircaloy-2 after pilgering using, X-ray diffraction line profile analysis
    Mukherjee, P.
    Gayathri, N.
    Chowdhury, P. S.
    Mitra, M. K.
    JOURNAL OF NUCLEAR MATERIALS, 2013, 434 (1-3) : 24 - 30
  • [10] Line profile analysis of synchrotron X-ray diffraction data of iron powder with bimodal microstructural profile parameters
    Bhakar, Ashok
    Gupta, Pooja
    Rao, P. N.
    Swami, M. K.
    Tiwari, Pragya
    Ganguli, Tapas
    Rai, S. K.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2021, 54 : 498 - 512