A method for grouping thyristors according to reliability using low-frequency noise and X-ray radiation

被引：0

作者：

M. I. Gorlov

D. Yu. Smirnov

E. A. Zolotareva

机构：

[1] Voronezh State Technical University,

来源：

Russian Journal of Nondestructive Testing | 2010年 / 46卷

关键词：

semiconductor device; dose; thyristor; noise; parameters; reliability; experiment;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Methods for grouping thyristors according to reliability using parameters of low-frequency noise under the action of X-ray radiation are demonstrated.

引用

页码：884 / 886

页数：2

共 10 条

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Kozen A.(1996)Analysis of the Processes in Power MOSFETs During Y-Ray Irradiation and Subsequent Thermal Annealing Phys. Status Solidi. A 155 371-379

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[5]

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