Simplification of Low-Temperature Sintering Nanosilver for Power Electronics Packaging

被引:0
作者
Yunhui Mei
Gang Chen
Yunjiao Cao
Xin Li
Dan Han
Xu Chen
机构
[1] Tianjin University,School of Chemical Engineering and Technology
[2] Tianjin University,Tianjin Key Laboratory of Advanced Joining Technology and School of Materials Science and Engineering
来源
Journal of Electronic Materials | 2013年 / 42卷
关键词
Nanosilver; sintering; pressure-assisted; electronic packaging; shear strength; microstructures;
D O I
暂无
中图分类号
学科分类号
摘要
Conventional solders cannot meet the requirements for high-temperature applications. Recently, a low-temperature sintering technique involving a nanosilver paste has been developed for attaching semiconductor chips to substrates. Sintered nanosilver joints showed high reliability in high-temperature applications. We used the nanosilver paste to attach 10 mm × 10 mm chips by introducing a pressure as low as only 1 MPa during drying at 185°C. Die-shear tests showed that shear strengths of higher than 50 MPa could be generated by applying 5 MPa at 225°C for only 10 s or 1 MPa at 150°C for 600 s, followed by sintering for only 60 s at 275°C. The sintering temperature could be reduced to 250°C in most applications with a slight reduction in shear strength. As a result of good bonding, significant plastic flow and ductile fracture of the sheared silver joint could be observed by scanning electron microscopy (SEM). SEM also showed that the fracture of the sheared silver joint was a cohesive failure.
引用
收藏
页码:1209 / 1218
页数:9
相关论文
共 110 条
[1]  
Mei YH(2009)undefined J. Electron. Mater. 38 2415-2426
[2]  
Chen X(2010)undefined IEEE Trans. Compon. Packag. Technol. 33 98-104
[3]  
Gao H(2010)undefined Mater. Sci. Eng. A 527 1367-1376
[4]  
Lei TG(2002)undefined IEEE Trans. Electron. Packag. Manuf. 25 279-283
[5]  
Calata JN(2008)undefined Acta Mater. 56 1820-1829
[6]  
Lu G-Q(2011)undefined IEEE Trans. Compon. Packag. Manuf. Technol. 1 495-501
[7]  
Chen X(2006)undefined IEEE Trans. Compon. Packag. Technol. 29 589-593
[8]  
Luo S(2007)undefined IEEE Trans. Adv. Packag. 30 506-510
[9]  
Zhang QK(2007)undefined J. Electron. Mater. 36 1333-1340
[10]  
Zhu QS(2007)undefined J. Mater. Res. 22 3494-3500