IR Photoluminescence of Silicon Irradiated with High-Energy Xe Ions after Annealing

被引:0
作者
S. G. Cherkova
V. A. Volodin
V. A. Skuratov
M. Stoffel
H. Rinnert
M. Vergnat
机构
[1] Rzhanov Institute of Semiconductor Physics,
[2] Siberian Branch,undefined
[3] Russian Academy of Sciences,undefined
[4] Novosibirsk State University,undefined
[5] Joint Institute for Nuclear Research (JINR),undefined
[6] National Research Nuclear University MEPhI (Moscow Engineering Physics Institute),undefined
[7] Dubna State University,undefined
[8] Université de Lorraine,undefined
[9] CNRS,undefined
[10] IJL,undefined
来源
Optoelectronics, Instrumentation and Data Processing | 2022年 / 58卷
关键词
photoluminescence; swift heavy ions; defects in silicon;
D O I
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中图分类号
学科分类号
摘要
引用
收藏
页码:633 / 642
页数:9
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