Edge-to-edge matching of lattice planes and coupling of crystallography and migration mechanisms of planar interfaces

被引:14
|
作者
J. F. Nie
机构
[1] Monash University,the Department of Materials Engineering
关键词
Material Transaction; Orientation Relationship; Simple Shear; Lattice Plane; Habit Plane;
D O I
10.1007/s11661-006-0057-3
中图分类号
学科分类号
摘要
The structure and migration mechanisms of planar interfaces are examined geometrically using the concept of edge-to-edge matching of lattice planes and the Moiré plane approach derived from this concept. The selected examples of planar interfaces include those associated with rational, nearrational, or irrational orientation relationships. It is demonstrated that the orientation and structure of planar interfaces associated with these orientation relationships can be rationalized by the Moiré plane approach, and that the migration of these interfaces in their normal directions can occur via successive nucleation and lateral gliding of growth ledges that are in the form of transformation disconnections, for low-index interfaces, and of Moiré ledges, for high-index interfaces. It is further demonstrated that a shear, and thus a shape change, is associated with the motion of all planar interfaces defined by the edge-to-edge matching of lattice planes.
引用
收藏
页码:841 / 849
页数:8
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