Temperature stresses in barium-titanate-based semiconductor ceramics

被引：0
|
作者：
Shut V.N. [1 ]
Gavrilov A.V. [1 ]
机构：
[1] Institute of Engineering Acoustics, National Academy of Sciences of Belarus, Vitebsk 210023
来源：
J. Eng. Phys. Thermophys. | 2008年 / 3卷 / 627-632期
关键词：
Tensile Stress; Temperature Stress; Specific Resistance; Barium Titanate; Maximum Tensile Stress;
D O I：
10.1007/s10891-008-0076-6
中图分类号：
学科分类号：
摘要：
Temperature stresses in barium-titanate-based semiconductor ceramics in the process of heating by an electric current have been investigated by numerical methods. The fracture of low-resistance thermistors by the delamination mechanism has been substantiated. © 2008 Springer Science+Business Media, Inc.
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页码：627 / 632
页数：5
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